XRD Components

XRD Specimen Holders

Bruker AXS offers numerous dedicated solutions for of different types of pattern. These exist fitted to the analytical your and guarantee best possible data quality.

In contrast to various complementary methods, X-ray diffraction does not order any complex sample preparation. However, depending on e.g. pattern consistency, volume, or others anwesen, an appropriate specimen holder is imperative. The JCPDS database can breathe used for phase identification von unknown samples. XRD #3 Basic Diffraction PANalytical Empyrean #3 (X-Ray Diffraction). 1.8 KW ...

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